PIE: Perpendicular-Incidence Ellipsometry-Application to the Determination of the Optical Properties of Uniaxial and Biaxial Absorbing Crystals
Document Type
Article
Publication Date
1-1-1976
Description
Perpendicular-incidence ellipsometry (to be given the acronym PIE) is simpler than oblique-incidence conventional or generalized ellipsometry as a tool for the characterization of optically anisotropic surfaces. To illustrate the potential usefulness and simplicity of PIE, we present an example of its application to the determination of the optical properties of uniaxially and biaxially anisotropic crystals.
Citation Information
Azzam, R. M.. 1976. PIE: Perpendicular-Incidence Ellipsometry-Application to the Determination of the Optical Properties of Uniaxial and Biaxial Absorbing Crystals. Optics Communications. Vol.19(1). 122-124. https://doi.org/10.1016/0030-4018(76)90401-6 ISSN: 0030-4018