PIE: Perpendicular-Incidence Ellipsometry-Application to the Determination of the Optical Properties of Uniaxial and Biaxial Absorbing Crystals

Document Type

Article

Publication Date

1-1-1976

Description

Perpendicular-incidence ellipsometry (to be given the acronym PIE) is simpler than oblique-incidence conventional or generalized ellipsometry as a tool for the characterization of optically anisotropic surfaces. To illustrate the potential usefulness and simplicity of PIE, we present an example of its application to the determination of the optical properties of uniaxially and biaxially anisotropic crystals.

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